Using Semiconductor Failure Analysis Tools for Security Analysis

Failure analysis tools like scanning electron microscopes and focused ion beam systems are commonly used in the manufacturing of modern integrated circuits. In addition to the conventional uses of these systems, they provide an adversary many ways to extract protected information from an integrated circuit and to defeat many security mechanisms that can be implemented. Since these systems are also fairly expensive, the number of adversaries with access to them is fairly limited, but it is likely that any facility capable of manufacturing modern integrated circuits also provides the capability to defeat many security features that can be implemented at the integrated circuit level.